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"eNVM RRAM reliability performance and modeling in 22FFL FinFET technology."
Yao-Feng Chang et al. (2020)
- Yao-Feng Chang, James A. O'Donnell, Tony Acosta, Roza Kotlyar, Albert B. Chen, Pedro A. Quintero, Nathan Strutt, Oleg Golonzka, Chris Connor, Jeff Hicks:
eNVM RRAM reliability performance and modeling in 22FFL FinFET technology. IRPS 2020: 1-4
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