"Exploring AC Time-Dependent Dielectric Breakdown (TDDB) Through Frequency ..."

Y. K. Chang et al. (2025)

> Home

Details and statistics

DOI: 10.1109/IRPS48204.2025.10983130

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/ChangLCCLLLH25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/ChangLCCLLLH25
Y. K. Chang, P. J. Liao, Y. C. Chang, C. H. Chou, Y. S. Liu, J. H. Lee, Ryan Lu, Y. K. Hwang:
Exploring AC Time-Dependent Dielectric Breakdown (TDDB) Through Frequency Noise Analysis. IRPS 2025: 11

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.