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"In-Product BTI Aging Sensor for Reliability Screening and Early Detection ..."

Tomasz Brozek et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118144

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/BrozekCWQCSHS23
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  - https://dblp.org/rec/conf/irps/BrozekCWQCSHS23
Tomasz Brozek, Alberto A. P. Cattaneo, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej J. Strojwas:
In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk. IRPS 2023: 1-4

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