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"Mission Profile Approach for the Calculation of GaN FET Reliability in ..."

Sandeep R. Bahl, Jungwoo Joh, Fei Yang (2024)

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DOI: 10.1109/IRPS48228.2024.10529428

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  dblp key:
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Sandeep R. Bahl, Jungwoo Joh, Fei Yang:
Mission Profile Approach for the Calculation of GaN FET Reliability in Power Supply Applications (Invited). IRPS 2024: 1-7

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