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"Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped ..."
Tarek Ali et al. (2020)
- Tarek Ali, Kati Kühnel, Malte Czernohorsky, Matthias Rudolph, Björn Pätzold, Ricardo Olivo, David Lehninger, Konstantin Mertens, Franz Müller, Maximilian Lederer
, Raik Hoffmann, Clemens Mart, Mahsa N. Kalkani, Philipp Steinke, Thomas Kämpfe
, Johannes Müller, Jan Van Houdt, Konrad Seidel, Lukas M. Eng:
Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells. IRPS 2020: 1-9
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