Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Impact of Extrinsic Variation Sources on the Device-to-Device Variation in ..."

Kai Ni et al. (2020)

> Home

Details and statistics

DOI: 10.1109/IRPS45951.2020.9128323

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/0006GPTHA20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/0006GPTHA20
Kai Ni, Aniket Gupta, Om Prakash, Simon Thomann, Xiaobo Sharon Hu, Hussam Amrouch:
Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET. IRPS 2020: 1-5

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.