"Impact of Extrinsic Variation Sources on the Device-to-Device Variation in ..."

Kai Ni et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128323

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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  dblp key:
  - conf/irps/0006GPTHA20
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  - https://dblp.org/rec/conf/irps/0006GPTHA20
Kai Ni, Aniket Gupta, Om Prakash, Simon Thomann, Xiaobo Sharon Hu, Hussam Amrouch:
Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET. IRPS 2020: 1-5

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