"A Scan-Bist Environment for Testing Embedded Memories."

Farzin Karimi, Fabrizio Lombardi (2002)

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DOI: 10.1109/OLT.2002.1030221

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Farzin Karimi, Fabrizio Lombardi:
A Scan-Bist Environment for Testing Embedded Memories. IOLTW 2002: 211-

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