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"Detecting the Existence of Malfunctions in Microcontrollers Utilizing ..."

Kento Hasegawa, Masao Yanagisawa, Nozomu Togawa (2018)

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DOI: 10.1109/IOLTS.2018.8474113

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Kento Hasegawa, Masao Yanagisawa, Nozomu Togawa:
Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis. IOLTS 2018: 97-102

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