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"Perspectives of Combining on-line and off-line Test Technology for ..."

Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus (2003)

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DOI: 10.1109/OLT.2003.1214396

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/iolts/GalkeGV03
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  persistent URL:
  - https://dblp.org/rec/conf/iolts/GalkeGV03
Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus:
Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. IOLTS 2003: 183-

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