"About the Correlation between Logical Identified Faulty Gates and their ..."

Paolo Bernardi et al. (2023)

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DOI: 10.1109/IOLTS59296.2023.10224897

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS 2023: 1-7

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