BibTeX record conf/iolts/AymerichABCCFGHMMPRRVVWZ11

download as .bib file

@inproceedings{DBLP:conf/iolts/AymerichABCCFGHMMPRRVVWZ11,
  author    = {Nivard Aymerich and
               A. Asenov and
               Andrew R. Brown and
               Ramon Canal and
               B. Cheng and
               Joan Figueras and
               Antonio Gonz{\'{a}}lez and
               Enric Herrero and
               S. Markov and
               Miguel Miranda and
               Peyman Pouyan and
               Tanaus{\'{u}} Ram{\'{\i}}rez and
               Antonio Rubio and
               Elena I. Vatajelu and
               Xavier Vera and
               X. Wang and
               Paul Zuber},
  title     = {New reliability mechanisms in memory design for sub-22nm technologies},
  booktitle = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
               13-15 July, 2011, Athens, Greece},
  pages     = {111--114},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://doi.org/10.1109/IOLTS.2011.5993820},
  doi       = {10.1109/IOLTS.2011.5993820},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/iolts/AymerichABCCFGHMMPRRVVWZ11.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of Schloss Dagstuhl - Leibniz Center for Informatics