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"Gauging Biases in Various Deep Learning AI Models."

Neil Tellez et al. (2022)

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DOI: 10.1007/978-3-031-16075-2_11

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-07

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  dblp key:
  - conf/intellisys/TellezSKLM22
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  - https://dblp.org/rec/conf/intellisys/TellezSKLM22
Neil Tellez, J. Serra, Yulia Kumar, J. Jenny Li, Patricia Morreale:
Gauging Biases in Various Deep Learning AI Models. IntelliSys (3) 2022: 171-186

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