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"Analysis and machine-learning based detection of outlier measurements of ..."

Yiming Quan et al. (2017)

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DOI: 10.1109/INDIN.2017.8104909

access: closed

type: Conference or Workshop Paper

metadata version: 2017-11-17

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  dblp key:
  - conf/indin/QuanLJNWC17
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Yiming Quan, Lawrence Lau, Faming Jing, Qian Nie, Alan Wen, Siu-Yeung Cho:
Analysis and machine-learning based detection of outlier measurements of ultra-wideband in an obstructed environment. INDIN 2017: 997-1000

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