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"Endurance improvements and defect characterization in ferroelectric FETs ..."

Yannick Raffel et al. (2022)

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DOI: 10.1109/IMW52921.2022.9779277

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-02

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  dblp key:
  - conf/imw2/RaffelOLMHAMPDB22
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  - https://dblp.org/rec/conf/imw2/RaffelOLMHAMPDB22
Yannick Raffel, Ricardo Olivo, Maximilian Lederer, Franz Müller, Raik Hoffmann, Tarek Ali, Konstantin Mertens, Luca Pirro, Maximilian Drescher, Sven Beyer, Thomas Kämpfe, Konrad Seidel, Lukas M. Eng, Johannes Heitmann:
Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination. IMW 2022: 1-4

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