"Charge trapping challenges of CMOS embedded complementary FeFETs."

Sven Beyer et al. (2024)

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DOI: 10.1109/IMW59701.2024.10536957

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Sven Beyer, Dominik Kleimaier, Stefan Dünkel, Halid Mulaosmanovic, Steven Soss, Johannes Müller, Zhouhang Jiang, Kai Ni, Thomas Mikolajick, Haidi Zhou:
Charge trapping challenges of CMOS embedded complementary FeFETs. IMW 2024: 1-4

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