"Transfer learning for automated optical inspection."

Seunghyeon Kim et al. (2017)

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DOI: 10.1109/IJCNN.2017.7966162

access: closed

type: Conference or Workshop Paper

metadata version: 2017-07-10

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Seunghyeon Kim, Wooyoung Kim, Yung-Kyun Noh, Frank Chongwoo Park:
Transfer learning for automated optical inspection. IJCNN 2017: 2517-2524

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