"Improved defect detection using support vector machines and wavelet ..."

Dimitrios A. Karras (2003)

> Home

Details and statistics

DOI: 10.1109/IJCNN.2003.1223774

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ijcnn/Karras03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ijcnn/Karras03
Dimitrios A. Karras:
Improved defect detection using support vector machines and wavelet feature extraction based on vector quantization and SVD techniques. IJCNN 2003: 2322-2327

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.