"Product Defect Detection Based on Multi-Class Classification."

Takumi Meguro, Shota Nakada, Qiangfu Zhao (2022)

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DOI: 10.1109/IIAIAAI55812.2022.00069

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-04

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Takumi Meguro, Shota Nakada, Qiangfu Zhao:
Product Defect Detection Based on Multi-Class Classification. IIAI-AAI 2022: 307-312

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