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"On systematic biases between modeled and measured SMOS brightness temperature."

Xiaobin Yin et al. (2012)

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DOI: 10.1109/IGARSS.2012.6352303

access: closed

type: Conference or Workshop Paper

metadata version: 2021-09-23

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  dblp key:
  - conf/igarss/YinBMS12
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  - https://dblp.org/rec/conf/igarss/YinBMS12
Xiaobin Yin, Jacqueline Boutin, Nicolas Martin, Paul Spurgeon:
On systematic biases between modeled and measured SMOS brightness temperature. IGARSS 2012: 5756-5759

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