"Built-in Test of Analog Non-Linear Circuits in a SOC Environment."

Luigi Carro et al. (2001)

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type: Conference or Workshop Paper

metadata version: 2002-08-13

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Luigi Carro, André C. Nácul, Daniel Janner, Marcelo Lubaszewski:
Built-in Test of Analog Non-Linear Circuits in a SOC Environment. VLSI-SOC 2001: 437-448

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