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"Characterization of fading of a MOS-based sensor for occupational ..."
Charilaos Mousoulis et al. (2016)
- Charilaos Mousoulis, Christian I. Elmiger, Manik Singhal, Yi Xuan, Timothy McNamee, James Thistlethwaite, Paul Alexander Walerow, Mark Salasky, Sean Scott, Daniel J. Valentino, Dimitrios Peroulis:
Characterization of fading of a MOS-based sensor for occupational radiation dosimetry. IEEE SENSORS 2016: 1-3
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