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"Ultra-Low Power Stress Sensing By Leakage Current of P-N Junctions."

Zhiqiang Feng et al. (2020)

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DOI: 10.1109/SENSORS47125.2020.9278597

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-05

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  dblp key:
  - conf/ieeesensors/FengHLLS20
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  persistent URL:
  - https://dblp.org/rec/conf/ieeesensors/FengHLLS20
Zhiqiang Feng, Xuefeng He, Junru Li, Shen Li, Zhengguo Shang:
Ultra-Low Power Stress Sensing By Leakage Current of P-N Junctions. IEEE SENSORS 2020: 1-4

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