"Scanning Electron Microscope Image Segmentation with Foundation AI Vision ..."

Timothy B. Gaines et al. (2024)

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DOI: 10.1109/CAI59869.2024.00224

access: closed

type: Conference or Workshop Paper

metadata version: 2025-10-07

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Timothy B. Gaines, Camden I. Boyle, James M. Keller, Matthew R. Maschmann, Stanton R. Price, Grant J. Scott:
Scanning Electron Microscope Image Segmentation with Foundation AI Vision Model for Nanoparticles in Autonomous Materials Explorations. CAI 2024: 1266-1271

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