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"Active thermal control for reliability improvement of MOS-gated power devices."
Alessandro Soldati et al. (2017)
- Alessandro Soldati
, Carlo Concari, Fabrizio Dossena, Davide Barater, Francesco Iannuzzo
, Frede Blaabjerg:
Active thermal control for reliability improvement of MOS-gated power devices. IECON 2017: 7935-7940
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