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"Power and Thermal Cycling Testbed for End of Life Assessment of ..."

Margo Molenaar et al. (2023)

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DOI: 10.1109/IECON51785.2023.10312731

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  - conf/iecon/MolenaarKSB23
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Margo Molenaar, Faezeh Kardan, Aditya Shekhar, Pavol Bauer:
Power and Thermal Cycling Testbed for End of Life Assessment of Semiconductor Devices. IECON 2023: 1-6

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