"Experimental Estimation of Parasitic Capacitance of Thermal Interface ..."

Kalyani V. Lande, J. Satheesh Reddy, Arun Karuppaswamy B (2024)

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DOI: 10.1109/IECON55916.2024.10905802

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-28

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Kalyani V. Lande, J. Satheesh Reddy, Arun Karuppaswamy B:
Experimental Estimation of Parasitic Capacitance of Thermal Interface Material Using Double Pulse Test Circuit under Realistic Operating Conditions. IECON 2024: 1-6

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