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"Comparison of Failure Rates According to Secondary Circuit Configurations ..."

Jae-Hun Cha et al. (2023)

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DOI: 10.1109/IECON51785.2023.10312381

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-25

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  dblp key:
  - conf/iecon/ChaJLKK23
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  - https://dblp.org/rec/conf/iecon/ChaJLKK23
Jae-Hun Cha, Jae-Sung Jo, Seong-Jin Lim, Feel-soon Kang, Tae-Jin Kim:
Comparison of Failure Rates According to Secondary Circuit Configurations of Full-Bridge Converters Using Fault-Tree Analysis. IECON 2023: 1-6

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