"Test set embedding into accumulator-generated sequences targeting ..."

Ioannis Voyiatzis et al. (2013)

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DOI: 10.1109/IDT.2013.6727147

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Ioannis Voyiatzis, Stelios Neophytou, Maria K. Michael, Stavros Hadjitheophanous, Cleo Sgouropoulou, Costas Efstathiou:
Test set embedding into accumulator-generated sequences targeting hard-to-detect faults. IDT 2013: 1-2

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