"RF and non-linearity characterization of porous silicon layer for RF-ICs."

Yasmina Belaroussi et al. (2014)

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DOI: 10.1109/IDT.2014.7038591

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Yasmina Belaroussi, Abdelhalim Slimane, Mohand-Tahar Belaroussi, Mohamed Trabelsi, Gilles Scheen, Khaled Ben Ali, Jean-Pierre Raskin:
RF and non-linearity characterization of porous silicon layer for RF-ICs. IDT 2014: 79-82

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