"A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing ..."

Tian Chen et al. (2008)

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DOI: 10.1109/ICYCS.2008.216

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tian Chen, Huaguo Liang, Minsheng Zhang, Wei Wang:
A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter. ICYCS 2008: 2272-2277

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