"Efficient Device-Edge Inference for Disaster Classification."

Nathaniel Tan Sze Yang et al. (2022)

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DOI: 10.1109/ICUFN55119.2022.9829668

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Nathaniel Tan Sze Yang, Mau-Luen Tham, Sing Yee Chua, Ying Loong Lee, Yasunori Owada, Suvit Poomrittigul:
Efficient Device-Edge Inference for Disaster Classification. ICUFN 2022: 314-319

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