"Effect of conductive filament morphology on soft error of oxide based ..."

Xu Zheng et al. (2021)

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DOI: 10.1109/ICTA53157.2021.9661604

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-30

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Xu Zheng, Jie Yu, Wenxuan Sun, Jinru Lai, Danian Dong, Guozhong Xing, Xiaoxin Xu:
Effect of conductive filament morphology on soft error of oxide based Resistive Random Access Memory. ICTA 2021: 247-248

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