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"Prediction of Key Metrics of Stacked Nanosheet nFETs using Genetic ..."

Haoqing Xu et al. (2022)

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DOI: 10.1109/ICTA56932.2022.9963088

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-24

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  dblp key:
  - conf/icta3/XuGCYW22
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  - https://dblp.org/rec/conf/icta3/XuGCYW22
Haoqing Xu, Weizhuo Gan, Lei Cao, Huaxiang Yin, Zhenhua Wu:
Prediction of Key Metrics of Stacked Nanosheet nFETs using Genetic Algorithm-based Neural Networks. ICTA 2022: 3-4

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