"Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash ..."

Yifang Xi et al. (2021)

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DOI: 10.1109/ICTA53157.2021.9661687

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type: Conference or Workshop Paper

metadata version: 2023-11-06

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Yifang Xi, Xiaotong Fang, Yachen Kong, Yifan Guo, Hongzhe Lin, Xuepeng Zhan, Jiezhi Chen:
Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory and its Applications to IoT Security. ICTA 2021: 69-71

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