"Modeling of Hot Carrier Injection on Gate-Induced Drain Leakage in PDSOI ..."

Yijun Qian et al. (2021)

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DOI: 10.1109/ICTA53157.2021.9661921

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-10

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Yijun Qian, Yuan Gao, Amit Kumar Shukla, Tao Wu, Xing Wei, Kai Lu, Yumeng Yang:
Modeling of Hot Carrier Injection on Gate-Induced Drain Leakage in PDSOI nMOSFET. ICTA 2021: 239-240

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