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"A study on an approach for analysing test basis using I/O test data patterns."

Tsuyoshi Yumoto, Tohru Matsuodani, Kazuhiko Tsuda (2015)

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DOI: 10.1109/ICSTW.2015.7107429

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/icst/YumotoMT15
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  persistent URL:
  - https://dblp.org/rec/conf/icst/YumotoMT15
Tsuyoshi Yumoto, Tohru Matsuodani, Kazuhiko Tsuda:
A study on an approach for analysing test basis using I/O test data patterns. ICST Workshops 2015: 1-8

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