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"A Model for T-Way Fault Profile Evolution during Testing."

D. Richard Kuhn, Raghu N. Kacker, Yu Lei (2017)

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DOI: 10.1109/ICSTW.2017.35

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-11

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D. Richard Kuhn, Raghu N. Kacker, Yu Lei:
A Model for T-Way Fault Profile Evolution during Testing. ICST Workshops 2017: 162-170

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