"Risk-Based Testing of Safety-Critical Embedded Systems Driven by Fault ..."

Johannes Kloos, Tanvir Hussain, Robert Eschbach (2011)

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DOI: 10.1109/ICSTW.2011.90

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Johannes Kloos, Tanvir Hussain, Robert Eschbach:
Risk-Based Testing of Safety-Critical Embedded Systems Driven by Fault Tree Analysis. ICST Workshops 2011: 26-33

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