"Assessing Software Product Line Testing Via Model-Based Mutation: An ..."

Christopher Henard et al. (2013)

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DOI: 10.1109/ICSTW.2013.30

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing. ICST Workshops 2013: 188-197

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