"A test-suite diagnosability metric for spectrum-based fault localization ..."

Alexandre Perez, Rui Abreu, Arie van Deursen (2017)

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DOI: 10.1109/ICSE.2017.66

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Alexandre Perez, Rui Abreu, Arie van Deursen:
A test-suite diagnosability metric for spectrum-based fault localization approaches. ICSE 2017: 654-664

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