"Takuan: Using Dynamic Invariants to Debug Order-Dependent Flaky Tests."

Nate Levin et al. (2025)

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DOI: 10.1109/ICSE-NIER66352.2025.00022

access: closed

type: Conference or Workshop Paper

metadata version: 2025-08-05

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Nate Levin, Chengpeng Li, Yule Zhang, August Shi, Wing Lam:
Takuan: Using Dynamic Invariants to Debug Order-Dependent Flaky Tests. NIER@ICSE 2025: 81-85

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