"Automated testing of industrial control devices: the delphi database."

Nate Kube, Kevin Yoo, Daniel Hoffman (2011)

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DOI: 10.1145/1982595.1982611

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Nate Kube, Kevin Yoo, Daniel Hoffman:
Automated testing of industrial control devices: the delphi database. AST 2011: 71-76

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