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"Identifying Defect Injection Risks from Analysis and Design Diagrams: An ..."

Yoji Imanishi, Kazuhiro Kumon, Shuji Morisaki (2023)

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DOI: 10.1109/ICSE-SEIP58684.2023.00044

access: open

type: Conference or Workshop Paper

metadata version: 2023-07-27

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Yoji Imanishi, Kazuhiro Kumon, Shuji Morisaki:
Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony. ICSE-SEIP 2023: 420-431

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