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"Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA."

Gabin An et al. (2022)

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DOI: 10.1109/ICSE-SEIP55303.2022.9793878

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-28

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  dblp key:
  - conf/icse/AnYSHHY22
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  - https://dblp.org/rec/conf/icse/AnYSHHY22
Gabin An, Juyeon Yoon, Jeongju Sohn, Jingun Hong, Dongwon Hwang, Shin Yoo:
Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA. ICSE (SEIP) 2022: 65-74

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