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"A new probing system for the in-circuit test of a PCB."

J. H. Shim, Hyung Suck Cho, S. Kim (1996)

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DOI: 10.1109/ROBOT.1996.503839

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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  dblp key:
  - conf/icra/ShimCK96
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  - https://dblp.org/rec/conf/icra/ShimCK96
J. H. Shim, Hyung Suck Cho, S. Kim:
A new probing system for the in-circuit test of a PCB. ICRA 1996: 590-595

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