"Three-layer Approach to Detect Anomalies in Industrial Environments based ..."

Daniel Gutierrez-Rojas et al. (2020)

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DOI: 10.1109/ICPS48405.2020.9274780

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type: Conference or Workshop Paper

metadata version: 2024-08-04

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Daniel Gutierrez-Rojas, Mehar Ullah, Ioannis T. Christou, Gustavo Matheus de Almeida, Pedro H. J. Nardelli, Dick Carrillo, Jean Michel de Souza Sant'Ana, Hirley Alves, Merim Dzaferagic, Alessandro Chiumento, Charalampos Kalalas:
Three-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning. ICPS 2020: 250-256

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