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"BEW-YOLO: An Improved Method for PCB Defect Detection Based on YOLOv7."

Zhiyao Li et al. (2023)

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DOI: 10.1109/ICPADS60453.2023.00048

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-14

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  dblp key:
  - conf/icpads/LiLZKL23
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  - https://dblp.org/rec/conf/icpads/LiLZKL23
Zhiyao Li, Aimin Li, Yuechen Zhang, Xiaotong Kong, Wenqiang Li:
BEW-YOLO: An Improved Method for PCB Defect Detection Based on YOLOv7. ICPADS 2023: 268-274

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