"Defect detection on EL images based on deep feature optimized by metric ..."

Kun Liu et al. (2019)

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DOI: 10.23919/ICONAC.2019.8895009

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-18

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Kun Liu, Jiangrui Han, Haiyong Chen, Haowei Yan, Peng Yang:
Defect detection on EL images based on deep feature optimized by metric learning for imbalanced data. ICAC 2019: 1-5

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