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"Yield improvement for GaAs IC manufacturing using neural network inverse ..."

Jacek M. Zurada, Andrzej Lozowski, Aleksander Malinowski (1997)

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DOI: 10.1109/ICNN.1997.616125

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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  - conf/icnn/ZuradaLM97
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Jacek M. Zurada, Andrzej Lozowski, Aleksander Malinowski:
Yield improvement for GaAs IC manufacturing using neural network inverse modeling. ICNN 1997: 800-805

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