"A Security Integrated Attestation Scheme for Embedded Devices."

Jiangnan Lin, Qiuxin Wu (2021)

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DOI: 10.1109/IC-NIDC54101.2021.9660438

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-12

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Jiangnan Lin, Qiuxin Wu:
A Security Integrated Attestation Scheme for Embedded Devices. IC-NIDC 2021: 489-493

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